ToF-SIMS as tool for profiling lipids in cancer and other diseases
Materials Science and Technology (2014)
Time of flight-secondary ion mass spectrometry (ToF-SIMS) is an ideal technique for probing lipids in situ in cells and other biological material. Sophisticated advances in instrumentation and methodology mean that higher sensitivity can be achieved than ever before, and in the quest to fight diseases prevalent in the twenty-first century, ToF-SIMS is a powerful addition to the analytical toolbox. Lipids play an essential role in cellular biochemical processes and as such, the malfunction of lipid synthesis pathways can result in disease. This article provides essential background to the technique and an overview of the current applications of ToF-SIMS in cancer and other diseases which have particular implications for lipid biochemistry. Challenges and successes are discussed.