ToF-SIMS and Laser Postionisation SNMS

Designed in collaboration with Prof. Nick Winograd’s group at Penn State University, KORE Technology Ltd. and Ionoptika Ltd.


Origin : KORE designed, UMIST/Penn State built
Primary Sources : Ionoptika liquid metal source
Au+/Au3+ or 69Ga+ projectile
25 keV beam energy at source
Pulse width usually 15 – 20 ns
Minimum spot size < 50 nmIonoptika fullerene source
C60+ projectile
20 keV beam energy at source
Minimum spot size < 1 µm
Sample Stage : High stability cold stage, ~ 90 K
Sample mounted horizontally
Sample potential 2.5 kV
Mass Analyser : Reflectron (two-stage)
Mounted vertically
Approximately 3 metre flight tube
High transmission/collection optics
Detector : Channelplate
2.7 kV gain
20 kV post-acceleration
Two options;
1. 1 ns TDC, EG&G
2. Transient digitiser, Signatec
Charge Compensation : Ionoptika electron flood source
10-1000 eV
Pulsed between ion gun pulses
Laser postionisation : Continuum PY61C-20
35 ps Nd:YAG
532, 355, 266 and 118 nm wavelengths available

Coherent LegendElite USP Ti:S, 35 femtosecond
3 um – 200 nm wavelengths available

Special Features : Freeze-fracture stage in the sample preparation chamber allows cryogenically stored samples to be analysed without atmospheric contamination.
Retrospective imaging software allows offline imaging capability.
Chemical imaging available in both SIMS and SNMS modes.
Projects Supported : Single photon laser postionisation studies
Multiphoton laser postionisation studies
Biological (cell) analysis
Self-assembled monolayers (and multilayers)
Textile analysis