Publication:
C60+ Secondary Ion Microscopy Using a Delay Line Detector.
Klerk, Leendert A.; Lockyer, Nicholas P.; Kharchenko, Andriy; MacAleese, Luke; Dankers, Patricia Y. W.; Vickerman, John C.; Heeren, Ron M. A.
Analytical Chemistry 82 (2010) 801–807 [go there now…]