MeV-SIMS Workshop

Alex gave an invited presentation at the Joint IAEA-SPIRIT-Japan Technical Meeting on Development and Utilization of MeV-SIMS held in Dubrovnik, Croatia, 21-25 May 2012.

The meeting was to determine the scope and prospects for the emerging MeV-SIMS technique and the outcome was very positive.

The presentation covered factors that influence the form of a Static SIMS spectrum and various issues that may arise in its interpretation and can be found here.

Chemical Biology Research Articles

Our recent article on Discrimination of Prostate Cancer Cells and Non-malignant Cells using Secondary Ion Mass Spectrometry, published in The Analyst and presenting some work by Matt and Ehsan, has been selected for inclusion in the Royal Society of Chemistry’s Chemical Biology Research Articles virtual journal. This virtual journal brings together all chemical biology literature from more than 15 RSC journals in order to raise its visibility and profile in the chemical biology community.

Enhancing new developments in ToF-SIMS through researcher exchanges

New funding:
Enhancing new developments in ToF-SIMS through researcher exchanges
We have been successful in securing EPSRC funds to bring expert researchers to Manchester and to send some of our group to the USA and The Netherlands. Later this year we will be hosting Professor Stephen Reichenbach from Nebraska University for three months and we will also be welcoming back Professors Nick Winograd and Barbara Garrison from Penn State University. Alex will be travelling to Nebraska next year and John (F) will be exchanging with a colleague from Professor Ron Heeren‘s group in Amsterdam. There is also funding for Professor Roger Webb of Surrey University to visit Penn State. [EPSRC award: EP/F012985/1, more information …]

Most Cited Paper

Thomson Scientific have recently acknowledged that our article introducing C60 as a primary ion source for ToF-SIMS, published in Analytical Chemistry in 2003, is one of the most cited papers in the field of Materials Science with 106 citations. Check out the article in ESI-Special Topics!

Full reference:
A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics.
Weibel, Daniel; Wong, Steve; Lockyer, Nicholas; Blenkinsopp, Paul; Hill, Rowland; Vickerman, John C.
Analytical Chemistry 75 (2003) 1754-1764 [go there now…]