A number of the group attended the 17th International Conference on Secondary Ion Mass Spectrometry (SIMS XVII) in Toronto. John F, Sadia, Ed and Alan all gave oral presentations with Alan and Ed also presenting posters.
Monthly Archives: September 2009
Review – Cellular imaging
Review article:
Cellular imaging with secondary ion mass spectrometry
John S. Fletcher
Analyst 134 (2009) 2204-2215 [go there now…]
Paper – multivariate analysis
Publication:
Explanatory multivariate analysis of ToF-SIMS spectra for the discrimination of bacterial isolates
Seetharaman Vaidyanathan, John S. Fletcher, Roger M. Jarvis, Alex Henderson, Nicholas P. Lockyer, Royston Goodacre and John C. Vickerman
Analyst 134 (2009) 2352-2360 [go there now…]