Thomson Scientific have recently acknowledged that our article introducing C60 as a primary ion source for ToF-SIMS, published in Analytical Chemistry in 2003, is one of the most cited papers in the field of Materials Science with 106 citations. Check out the article in ESI-Special Topics!
A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics.
Weibel, Daniel; Wong, Steve; Lockyer, Nicholas; Blenkinsopp, Paul; Hill, Rowland; Vickerman, John C.
Analytical Chemistry 75 (2003) 1754-1764 [go there now…]